Phase 12 Features
The Analysis Tech Phase 12 Thermal Analyzer is a comprehensive semiconductor thermal tester offering a wide range of steady state and transient thermal measurements for use in production and development environments with powerful features such as:
All Test Modes:
- Testing all devices: diodes, LEDs, bipolar, MOSFET, IGBT, functional IC, thryistors, test dies
- Full 3-terminal and 2-terminal test modes for MOSFETs, IGBTs, bipolars
- Automated high speed data collection, reduction, and analysis for transient and steady state data
- Transient RC models generated directly from measured junction temperature heating/cooling
- Compatible with all 750E Mil Stds and JEDEC 51 Series methods
- Rjc measurement with JEDEC 51-14 transient method
- Transient data plots for all test parameters in all tests modes
- Simple, automated instrument-calibration procedures
- Multiple text and graphics file formats for convenient exporting
- Continuous intelligent monitoring for errors and data validity
- Kelvin (4-wire) connections to eliminate test cable resistances effects
- Selection of automatic power-control by current, wattage, and ΔTj
- Standard and custom test fixturing available
Steady State Thermal Resistance Mode:
- Multi-junction temperature sensing capability for ICs & multi-die devices
- User-selectable thermal equilibrium criteria
- Batch-mode for determining power level and air flow effects
- Control of accessory laboratory equipment for integrated testing
- Capability for automatically switching the device under test
Die Attach or Power Pulse Mode:
- High speed thermal evaluation with test duration less than 1 second
- Pass/Fail or bin sorting based on die-attach quality
- Data plots of all parameters including die-attach histogram
- Extended-life testing with interspersed die-attach testing
- Interface for mechanized device handlers
- Batch mode die-attachment production testing multi-chip modules
Heating Characterization / Transient Thermal Impedance Mode:
- Heating and cooling curve time-resolution: 1 microsecond
- Heating and cooling curve span: 1 microsecond - 1000 seconds
- Rjc measurement with JEDEC 51-14 dual transient method
- Utilizes structure function analysis, cumulative and differential
- Produces high-order RC models and optimized compact dynamic RC models in Cauer and Foster topologies
Surge Batch Test Mode:
- Selectable Surge Pulse Duration: 5 to 20 milliseconds
- Selectable Surge Pulse Magnitude: 1000 amps max.
- Selectable Number of Surges: 1 to 100
- Selectable Surge Interval: 0 to 1000 seconds
- Selectable Steady State Current Between Surges: 0 to 1000 amps max.
Comparison of Phase 11 to Phase 12 Thermal Analyzers:
- 1 Megahertz sampling rate versus 333 Kilohertz
- Compatible with all existing Analysis Tech fixturing.
- Enhanced WinTherm Software for Shorter Test Durations
- Improved Signal-to-Noise Ratio
- Self-installation WinTherm CD