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Electronics Reliability Testers - Semiconductor Thermal Analyzers, Event Detectors, TIM Testers, CTE Testers

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128-256F

STD Series

  • Economical, High-Channel Count Electrical 
  • Monitors for Solder Joint Reliability Testing
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32-106F

105 / 106 Series

  • The Model 32-106 Event Detector -
  • High Versatility, Medium Speed Event Detector
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32 EHD-bright3

EHD Series

  • The Model 32EHD Event Detector
  • High Speed (1 nS) Event Detector
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Event Detectors

Event Detectors are designed for high-precision reliability testing of solder joints, electrical connectors, and interconnect systems. By continuously monitoring electrical resistance during accelerated aging and stress testing, they enable early detection of performance degradation and intermittent connection failures.

As interconnect technologies evolve—particularly with the adoption of lead-free solder—rigorous reliability qualification has become essential to prevent premature field failures. Event Detectors address this need by capturing short-duration resistance changes across a large number of channels in real time.

Unlike traditional systems that rely on channel scanning, Event Detectors provide uninterrupted, continuous monitoring on all channels simultaneously, ensuring no loss of failure-event data. They are fully compliant with industry standards, including IPC-SM-785, IPC-9701, and JESD22-B111.  A comprehensive range of Event Detector models meets diverse testing requirements aligned with major industry standards, including JEDEC, IPC, EIA, and MIL-STD.

This capability makes Event Detectors indispensable for interconnect reliability testing across demanding industries such as telecommunications, computing, automotive, aerospace, and medical devices.

Event Detectors

  • STD Event Detectors
  • 105/106 Series
  • EHD Series
  • Introduction & Overview
  • Event Detector Glossary
  • Event Detector Comparison
  • Interconnect Reliability Test Standards
  • Event Detector Calibrations
  • WinDatalog Software
  • Event Detector Custom Designs

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