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Electronics Reliability Testers - Semiconductor Thermal Analyzers, Event Detectors, TIM Testers, CTE Testers

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TIM F

TIM Testers

Instruments that perform bulk Thermal Conductivity measurements on a wide variety of materials. Well suited to both development labs and production/quality control environments.

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CTEF

CTE Tester

Instruments that perform Coefficient of Thermal Expansion (CTE)  measurements on a wide variety of materials. Well suited to both development labs and production/quality control environments.

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Material Thermal Testers

TIM Testers perform bulk thermal conductivity measurements on a wide variety of materials including those types most commonly used in electronics packaging applications. The test method used is ASTM D5470.

CTE Testers perform co-efficient of thermal expansion (CTE) measurements on a wide variety of materials including those types most commonly used in electronics packaging applications. The test methods used are ASTM D696 and ASTM E228.

Material Thermal Testers

  • TIM Testers
  • CTE Tester

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