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Electronics Reliability Testers - Semiconductor Thermal Analyzers, Event Detectors, TIM Testers, CTE Testers

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CTE Chip Chuck

The Chip Chuck is used to measure the coefficient of linear thermal expansion or in-plane thermal expansion of leadless semiconductor packages. This fixture is compatible with the Analysis Tech  CTE-360 Coefficient of the Thermal Expansion Tester. The fixture is comprised of a one-piece, high conductivity metal chuck that mates a thin quartz rod with a leadless semiconductor package inside the CTE-360 Tester test chamber.

The test method for leadless package testing follows the ASTM 696 and ASTM E228 test standards, but with the addition of a chuck for maintaining consistent sample-orientation and position during testing.  This chuck enables CTE high accuracy testing for device packages ranging from 3 to 13 mm.

Maximum Sample size: 13mm x 13mm x 2mm*
*Custom chuck sizes available to accommodate different chip sizes.

The CTE-360 Tester can also be used to measure any solid material as well as some viscous liquid materials with the Liquid Sample Holder.

 

 

 

 

 

 

 

 

Material Thermal Testers

  • TIM Testers
  • CTE Tester

CTE Testers

  • CTE Tester Features
  • CTE-360 Specifications
  • CTE Technical Information
  • Thermal Expansion Test Service
  • CTE Case-Study Example

CTE Accessories

  • CTE Tester Liquid Sample Holder
  • CTE Tester Thin Sample Holder
  • CTE Chip Chuck
  • CTE-360 Draft Shield

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