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Custom Event Detectors

If your test specifications are not clearly satisfied by the Event Detectors described in this catalog, contact our engineering staff for guidance. The solutions that we can offer generally fall into three categories; examples of each are provided below.

Engineered Solutions for Custom Test Requirements:

  • Application notes to service special test requirements using standard Event Detectors
  • Custom preamplifiers to modify the specifications of standard Event Detectors
  • Custom instrument modules installed into standard chassis to create new Event Detector

Example Application Note: Using STD Event Detectors for High Current Testing
The normal test current for an STD Event Detector is 1.75 mA maximum. This application note provides a simple procedure for using an STD Event Detector at test currents as high as 5 amps! The solution requires an external power supply for the high current and can be implemented for any number of channels. Except for the high test current, all other test specifications are identical to those of the standard STD Event Detector. Typical turnaround-time: 1 day.

Example Custom Preamplifier: Opto-32 for Fiberoptic Event Testing
To test fiber optic systems during vibration, a custom interface between the optical fibers and the electrical input of the 32-106 Event Detector was required. This was accomplished with a custom preamplifier module with fiberoptic FC connectors, receivers, and amplifiers with span and offset adjustments for each channel. The 32-106 Event Detector provided the core of the test system with flexible selection of optical attenuation threshold and minimum duration detection. The custom optical preamplifier was designed with mechanical characteristics of the HLV Amplifier.

Example Custom Event Detector: Model 16KSP for Floating Intermittent "shorts" and "opens"
The Model 16KSP Event Detector offers 8 normally closed channels for detecting "opens" or high resistance spikes in the test specimens. It also offers 8 normally open channels for detecting "shorts" or low resistance spikes in the test specimens. Most Event Detectors offer only normally closed detection that would be used for specimens that exhibit a low resistance in the "good" or unfailed condition. The normally-open test condition would be used for test specimens where a high resistance would be the "good" or unfailed condition much like a normally open relay contact. A unique feature of the Model 16KSP is that the 8 normally closed channels are electrical isolated or floating and thus act as differential channels. In this situation, each channel has its own sense current return line rather than the typical Event Detector method of using a common ground return.

Features

  • Selected normally closed threshold from 100 to 5K ohms
  • Selected normally open threshold from 50K to 1M ohms
  • Tightly controlled Minimum Event Duration cutoff, +/-2%
  • Full self-test capability in manual and automatic modes
  • Channel sense current less than 1 mA
  • Adjustable open circuit volt
  • Minimum Event Duration 0.5 - 0.55 microseconds

The Model 16KSP has evolved in response to the need to test torque motor windings on gyro-stabilized inertial guidance platforms. The normally closed channels monitor the coils for discontinuity. The normally open channels monitor each coil for electrical shorting to the motor case. It is suited to vibration testing of electrical interconnects enclosed in a conductive housing or for relay testing of normally closed and normally open contacts.

The normally open channels on the Model 16KSP perform the opposite function as the normally closed channels. Normally open testing consists of monitoring a high resistance current loop for low resistance "spikes" or shorts in the loop. This type of testing is also termed "insulation failure at low voltage". The resistance of a channel is monitored continuously by comparison to the preset lower threshold resistance . If the resistance of the channel drops below this threshold for at least the Minimum Event Duration, then the event will be flagged.

Example Custom Event Detector: Model 32LSP Event Detector
The Model 32LSP offers 16 normally closed and 16 normally open channels with continuous monitoring at two distinct Minimum Event Durations. The 32LSP is ideal for testing relays in vibration for closed contact "chatter" or "bounce" and open contacts for "cross-over" or "shorting". The 32LSP features the same robust environmental noise immunity and unattended data collection with WinDatalog software as other Event Detectors. The following specifications represent the standard Model 32LSP although this unit can be provided in a wide range of test specifications.

Features

  • Selected normally closed threshold from 100 ohms to 5K ohms
  • Selected normally open threshold from 50K ohms to 1M ohms
  • Tightly controlled Minimum Event Duration cutoff, +/-2%
  • Full self-test capability in manual and automatic modes
  • Channel sense current less than 1 mA
  • Minimum duration detection: normally closed 1 microsec, normally open 10 micros
  • Open circuit voltage 6V
  • Convenient front panel display of channel flag status

Contact Analysis Tech engineering staff to discuss your test requirements!

 

Event Detectors

  • STD Event Detectors
  • 105/106 Series
  • EHD Series
  • Introduction & Overview
  • Event Detector Glossary
  • Event Detector Comparison
  • Interconnect Reliability Test Standards
  • Event Detector Calibrations
  • WinDatalog Software
  • Event Detector Custom Designs

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