Semiconductor Thermal Analyzers
Analysis Tech Semiconductor Thermal Analyzers measure semiconductor junction temperatures using the electric method of junction temperature measurement on all types of semiconductor devices. This capability is the foundation of numerous test methods including: steady-state thermal resistance, transient thermal impedance, die attach screening and functional power cycling. The convenient flexibility of the analyzer also facilitates interconnected control of other laboratory test equipment. All equipment and test methods offered conform to applicable JEDEC and MIL Standards.
Analysis Tech Thermal Analyzers perform full transient thermal measurements on all types of packaged semiconductor devices including diodes, LEDs, bipolar transistors, MOSFETs, functional analog/digital integrated circuits, IGBTs, SCRs, TRIACs, and thermal-test-dies. They also provide power control for 3 terminal devices with independent selection of voltage and current for much greater flexibility and heating power over that attainable when testing 3-terminal device in 2-terminal mode. Power pulse testing also allows transient thermal evaluation with test durations of less than 1 second. Complete transient test capabilities provide structure function plots, heating curves, time-constant spectra, and discrete thermal RC network models.
Using the electrical method of junction temperature measurement, Analysis Tech Thermal Analyzers accurately measure component thermal parameters - essential for design and implementation of thermally reliable electronics. In addition to equipment sales, Analysis Tech offers Component Test Services for thermal characterization of semiconductor devices at our factory test-laboratory.
This type of test equipment is alternately known as: semiconductor thermal resistance testers, semiconductor thermal impedance testers, component thermal resistance testers, component thermal impedance testers, die attach testers, die attachment testers.