The Model 32EHD High Speed (1 nS) Event Detector
The Model 32EHD Event Detector is designed to monitor electrical connectors undergoing reliability testing. This instrument detects nanosecond-range electrical resistance fluctuations characteristic of malfunctioning electrical contacts. This TEMPEST-level hardened design offers robust environmental EMI/RFI noise immunity and 32 channels with selectable test specifications.
The Model 32EHD utilizes matched impedance channel inputs and test cables which permits the use of 10 foot long test cables while maintaining very rapid event rise-times and sub-nanosecond duration detection capabilities. The Sense Current and Minimum Event Duration sensitivity for all channels are selectable with front panel control knob settings. A front panel meter and adjustment knob is provided for the Resistance Threshold setting. A simple 32-LED-display is also present on the front panel to indicate when an event has been detected on each channel.
- Selectable resistance threshold: .5 to 20 ohms
- Selectable Minimum Event Duration: 1, 10, and 50 nanoseconds (others
- Selectable sense current: 10, 20, 50, and 100mA
- Convenient front panel display of channel flag status
- Test cables included: RG-223 coax double-ended BNC, 10 ft. length, 80°C max. (high-temp RG-400/U also available)
- 32EHD Patch Panel Kit included
Features Included with All Event Detectors:
- WinDatalog, automatic data collection/analysis software
- RS232C serial port for data transmission to PC computer
- Linkable with other Event Detectors with linking cable
- Limited warranty, 1 year parts and labor
TEMPEST level environmental noise immunity is designed into the Model 32EHD Event Detector for immunity to the highest bandwidth environmental noise, even at low resistance thresholds. Double-ended, 10 foot RG-223 coax test cables and the 32EHD Patch Panel Kit are included for connecting the Event Detector to the samples under test. These test cables provide RFI shielding as well as the matched impedance transmission-line characteristics necessary for very short duration event detection.
The Model 32EHD offers three standard Minimum Event Duration settings: 1, 10, and 50 nanoseconds. Alternative Minimum Event Duration settings to replace the 10 and 50 ns settings may be specified at the time of purchase, within the range of 2 to 100 nanoseconds. The 1 nanosecond setting cannot be changed. A front panel knob provides convenient Minimum Event Duration selection. The sense current selections are 10, 20, 50, and 100 milliamps, although other custom values are available. Analysis Tech specializes in personalized service and welcomes inquiries and requests for custom applications.
32-EHD Event Detector Options
|Threshold Resistance Range||0.5 to 20 ohms|
|Typical Threshold Resistance Tolerance||+/- 2%|
|Maximum Threshold Resistance Tolerance||+/- 5%|
|Channel Current-Source Max Compliance||3.5 volts|
|Maximum Channel Sense Current||100 mA maximum|
|Minimum Duration Event Detection Tolerance|| 1ns: +0nS / -0.5ns,
other ranges: +0nS / -1.0nS -10%
|Supply Voltage||120VAC, 60Hz, 3 amps (unless otherwise specified)|
|Dimensions||8" H x 18" W x 17" D|
System includes: WinDatalog Software Package, 32EHD series test input cables (RG-223/U, 10 ft.), 32EHD Patch Panel Kit, serial cable (10 ft.) for PC, calibration report, and instruction manuals.
Order number 32EHD, where the standard Minimum Event Durations settings are 1, 10, and 50 nanoseconds. Also specify AC supply voltage if other than 120VAC 60Hz. Allow 6 weeks for standard delivery. FOB Wakefield. Custom orders welcome.